EMC Impact of Disturbances Generated by Multiple Sources

In this paper, the impact of an increasing number arbitrary electrical/electronic devices on overall radiated emissions is investigated. Understanding and quantifying such are prerequisites to proper evaluation electromagnetic compatibility (EMC) various electronic systems and, if needed, revisiting international standards. To evaluate from multiple devices, each device characterized using equivalent Huygens’s surface, in which tangential components electric magnetic near fields calculated (or measured). The emission can be for phase (correlated or uncorrelated), position, orientation. influence several parameters affecting including disturbance sources, polarization device, radiation pattern location orientation shifts between analyzed. numerical results show that mentioned have a significant effect emissions, cannot neglected EMC considerations. general, leads increase level emissions. However, depends other as arrangement (the distance and/or device). proposed method straightforwardly applied by near-field measurements multimodular large equipment with long cables.